Manoj Sachdev,
José Pineda de Gyvez
Springer US
2e druk, 2007
9780387465463
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Specificaties
Gebonden, 328 blz.
|
Engels
Springer US |
2e druk, 2007
ISBN13: 9780387465463
Rubricering
Onderdeel van serie
Frontiers in Electronic Testing
Levertijd ongeveer 9 werkdagen
Gratis verzonden
Samenvatting
The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.
Specificaties
ISBN13:9780387465463
Taal:Engels
Bindwijze:gebonden
Aantal pagina's:328
Uitgever:Springer US
Druk:2
Inhoudsopgave
Functional and Parametric Defect Models.- Digital CMOS Fault Modeling.- Defects in Logic Circuits and their Test Implications.- Testing Defects and Parametric Variations in RAMs.- Defect-Oriented Analog Testing.- Yield Engineering.- Conclusion.