Kai-Yuan Cai
Springer US
0e druk, 2012
9781461375593
Software Defect and Operational Profile Modeling
Specificaties
Paperback, 268 blz.
|
Engels
Springer US |
2012
ISBN13: 9781461375593
Rubricering
Onderdeel van serie
International Series in Software Engineering
Levertijd ongeveer 9 werkdagen
Gratis verzonden
Samenvatting
also in: THE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER AND INFORMATION SCIENCE, Volume 1
Specificaties
ISBN13:9781461375593
Taal:Engels
Bindwijze:paperback
Aantal pagina's:268
Uitgever:Springer US
Druk:0
Hoofdrubriek:Programmeren, Computer en informatica
Inhoudsopgave
Preface. 1. Introduction. 2. Empirical Regression Methods. 3. Dynamic Methods. 4. Capture-Recapture Methods. 5. Decomposition Methods. 6. Neural Network Methods. 7. Software Defect Estimations Under Imperfect Debugging. 8. Software Operational Profile Modelling. 9. Modeling of Probably Zero-Defect Software. Index.