Ricardo Reis,
Yu Cao,
Gilson Wirth
Springer New York
2015e druk, 2014
9781461440772
Circuit Design for Reliability
Specificaties
Gebonden, 272 blz.
|
Engels
Springer New York |
2015e druk, 2014
ISBN13: 9781461440772
Rubricering
Levertijd ongeveer 9 werkdagen
Gratis verzonden
Samenvatting
This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.
Specificaties
ISBN13:9781461440772
Taal:Engels
Bindwijze:gebonden
Aantal pagina's:272
Uitgever:Springer New York
Druk:2015
Inhoudsopgave
Introduction.- Recent Trends in Bias Temperature Instability.- Charge trapping phenomena in MOSFETS: From Noise to Bias Temperature Instability.- Atomistic Simulations on Reliability.- On-chip characterization of statistical device degradation.- Circuit Resilience Roadmap.- Layout Aware Electromigration Analysis of Power/Ground Networks.- Power-Gating for Leakage Control and Beyond.- Soft Error Rate and Fault Tolerance Techniques for FPGAs.