Masanori Okuyama,
Yoshihiro Ishibashi
Springer Berlin Heidelberg
2005e druk, 2005
9783540241638
Ferroelectric Thin Films
Basic Properties and Device Physics for Memory Applications
Specificaties
Gebonden, 244 blz.
|
Engels
Springer Berlin Heidelberg |
2005e druk, 2005
ISBN13: 9783540241638
Rubricering
Onderdeel van serie
Topics in Applied Physics
Levertijd ongeveer 9 werkdagen
Gratis verzonden
Samenvatting
Ferroelectric thin films continue to attract much attention due to their developing applications in memory devices, FeRAM, infrared sensors, piezoelectric sensors and actuators. This book, aimed at students, researchers and developers, gives detailed information about the basic properties of these materials and the associated device physics. The contributing authors are acknowledged experts in the field.
Specificaties
ISBN13:9783540241638
Taal:Engels
Bindwijze:gebonden
Aantal pagina's:244
Uitgever:Springer Berlin Heidelberg
Druk:2005
Inhoudsopgave
Theoretical Aspects of Phase Transitions in Ferroelectric Thin Films.- Chemical Solution Deposition of Layered-Structured Ferroelectric Thin Films.- PB-Based Ferroelectric Thin Films Prepared by MOCVD.- Spontaneous Polarization and Crystal Orientation Control of MOCVD PZT and Bi4Ti3O12-Based Films.- Rhombohedral PZT Thin Films Prepared by Sputtering.- Scanning Nonlinear Dielectric Microscope.- Analysis of Ferroelectricity and Enhanced Piezoelectricity near Morphotropic Phase Boundary.- Correlation between Domain Structures in Dielectric Properties in Single Crystals of Ferroelectric Solid Solutions.- Relaxor Behaviors in Perovskite-Type Dielectric Compounds.- Artificial Control of Ordered/Disordered State of B-Site Ions in Ba(Zr,Ti)O3 by a Superlattice Technique.- Physics of Ferroelectric Interface: An Attempt to Nano-Ferrolectric Physics.- Preparation and Property of Ferroelectic-Insulator-Semiconductor Junction Using YMNO3 Thin Film.- Improvement of Memory Retention in Metal-Ferroelectric-Insulator-Semiconductor (MFIS) Structure.