C. Claeys,
E. Simoen
Springer Berlin Heidelberg
0e druk, 2010
9783642077784
Radiation Effects in Advanced Semiconductor Materials and Devices
Specificaties
Paperback, 404 blz.
|
Engels
Springer Berlin Heidelberg |
2010
ISBN13: 9783642077784
Rubricering
Onderdeel van serie
Springer Series in Materials Science
Levertijd ongeveer 9 werkdagen
Gratis verzonden
Samenvatting
This wide-ranging book summarizes the current knowledge of radiation defects in semiconductors, outlining the shortcomings of present experimental and modelling techniques and giving an outlook on future developments. It also provides information on the application of sensors in nuclear power plants.
Specificaties
ISBN13:9783642077784
Taal:Engels
Bindwijze:paperback
Aantal pagina's:404
Uitgever:Springer Berlin Heidelberg
Druk:0
Inhoudsopgave
Radiation Environments and Component Selection Strategy.- Basic Radiation Damage Mechanisms in Semiconductor Materials and Devices.- Displacement Damage in Group IV Semiconductor Materials.- Radiation Damage in GaAs.- Space Radiation Aspects of Silicon Bipolar Technologies.- Radiation Damage in Silicon MOS Devices.- GaAs Based Field Effect Transistors for Radiation-Hard Applications.- Opto-Electronic Components for Space.- Advanced Semiconductor Materials and Devices - Outlook.