Advances in Imaging and Electron Physics

Specificaties
Gebonden, blz. | Engels
Elsevier Science | 2009
ISBN13: 9780123747624
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Elsevier Science e druk, 2009 9780123747624
€ 269,75
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Samenvatting

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Specificaties

ISBN13:9780123747624
Taal:Engels
Bindwijze:Gebonden

Inhoudsopgave

1.Photometric Stereo: an overview, M. Petrou, A. Vasileios<br>2. The Fourier Transform in Clifford Analysis, F. Brackx, N. De Schepper, F. Sommen<br>3. Carbon nanotube electron sources for electron microscopes, N. de Jonge<br>4. Localized Waves: A Review, E. Recami, M. Zamboni-Rached
€ 269,75
Levertijd ongeveer 9 werkdagen
Gratis verzonden

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        Advances in Imaging and Electron Physics