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Elements of X-Ray Diffraction

Pearson New International Edition

Specificaties
Paperback, blz. | Engels
Pearson Education | 2013
ISBN13: 9781292040547
Rubricering
Pearson Education e druk, 2013 9781292040547
€ 90,94
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Samenvatting

Designed for Junior/Senior undergraduate courses.

This revision of a classical text is intended to acquaint the reader, who has no prior knowledge of the subject, with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The text is a collection of principles and methods designed directly for the student and not a reference tool for the advanced reader

Specificaties

ISBN13:9781292040547
Taal:Engels
Bindwijze:Paperback

Inhoudsopgave

<br> <br> &nbsp;1. Properties of X-rays. <br> <br> <br> &nbsp;2. Geometry of Crystals. <br> <br> <br> &nbsp;3. Diffraction I: Directions of Diffracted Beams. <br> <br> <br> &nbsp;4. Diffraction II: Intensities of Diffracted Beams. <br> <br> <br> &nbsp;5. Diffraction III: Non-Ideal Samples. <br> <br> <br> &nbsp;6. Laure Photographs. <br> <br> <br> &nbsp;7. Powder Photographs. <br> <br> <br> &nbsp;8. Diffractometer and Spectrometer. <br> <br> <br> &nbsp;9. Orientation and Quality of Single Crystals. <br> <br> <br> 10. Structure of Polycrystalline Aggregates. <br> <br> <br> 11. Determination of Crystal Structure. <br> <br> <br> 12. Precise Parameter Measurements. <br> <br> <br> 13. Phase-Diagram Determination. <br> <br> <br> 14. Order-Disorder Transformation. <br> <br> <br> 15. Chemical Analysis of X-ray Diffraction. <br> <br> <br> 16. Chemical Analysis by X-ray Spectrometry. <br> <br> <br> 17. Measurements of Residual Stress. <br> <br> <br> 18. Polymers. <br> <br> <br> 19. Small Angle Scatters. <br> <br> <br> 20. Transmission Electron Microscope. <br>
€ 90,94
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        Elements of X-Ray Diffraction